Automatic Test Pattern Generation in VLSI MCQ Quiz – Objective Question with Answer for Automatic Test Pattern Generation in VLSI

1. Automatic test pattern generator detects only the fault and not its cause.

A. true
B. false

Answer: B

The test patterns generated using an automatic test pattern generator are used to detect the faults and in some cases, it assists in finding the cause of the failure too.

 

2. The automatic test pattern generator method has ________ phases.

A. two
B. three
C. four
D. five

Answer: A

The automatic test pattern generator method has two phases – fault activation and fault propagation phase.

 

3. Faults that produce the same faulty behavior are known as

A. similar faults
B. equivalent faults
C. correlative faults
D. ambiguous faults

Answer: B

Two or more faults may produce the same faulty behavior for all input patterns and these faults are known as equivalent faults.

 

4. The process of removing equivalent faults is called as

A. equivalent removing
B. bulk damaging
C. fault collapsing
D. fault reduction

Answer: C

The process of removing equivalent faults from the entire set of faults is called as fault collapsing. Any single fault from the whole set of equivalent faults can represent it.

 

5. ‘n’ signal lines can potentially have _____ stuck-at faults.
A. n2
B. 2n
C. n
D. n/2

Answer: B

If a circuit has n signal lines, then potentially it can have 2n stuck-at faults defined on the circuit.

 

6. The stuck-at model is a _____ fault model.

A. recurring
B. equivalent
C. simple
D. logical

Answer: D

The stuck-at model is a logical fault model because no delay information is associated with the fault definition.

 

7. Stuck-at fault is an example of the ______ fault model.

A. transient
B. permanent
C. intermittent
D. simple

Answer: B

Stuck-at fault model is also called a permanent fault model because the faulty effect is assumed to be permanent.

 

8. Transient faults does not depend on operating condition.

A. true
B. false

Answer: B

Transient faults occur sporadically depending on operating conditions and on the data values on surrounding signal lines.

 

9. The _________ between two signals is called a bridging fault.

A. open circuit
B. break
C. connection
D. short circuit

Answer: D

A short circuit between two signal lines is called a bridging fault and it is similar to the stuck-at fault model.

 

10. The sum of all propagation delays along a single path is given as

A. gate delay fault
B. transition fault
C. path delay fault
D. propagation fault

Answer: C

Path delay fault is given as the sum of all propagation faults along a single path. This fault shows that delay of one or more paths exceeds the clock period.

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