11. Which method is used to determine structural defects?
A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
12. Which is known as the stored test pattern method?
A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
13. Which method uses a finite state machine for developing the test pattern?
A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
14. A n-bit counter produces ______ number of total input combinations.
A. 2(n-1)
B. 2(n+1)
C. 2n
D. 2n
15. Exhaustive test pattern determines
A. gate-level faults
B. logic level faults
C. functional faults
D. structural faults
16. Exhaustive test pattern also detects delay faults.
A. true
B. false
17. Which is not suitable for circuits having large N values?
A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. deterministic test pattern method
18. Which method needs fault simulation?
A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. deterministic test pattern method
19. In which method sequences are repeatable?
A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. pseudo-random test pattern method
20. Which method is used for external functional testing?
A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. pseudo-random test pattern method