21. Pseudorandom testing can determine the test length.
A. true
B. false
Answer: A
Pseudo-random testing can also determine the relationship between test confidence, fault coverage, fault detectability, and test length can also be determined.
22. The pseudo-random testing has
A. high cost
B. less development time
C. low cost but more testing time
D. low cost and less testing time
Answer: B
Pseudo-random testing method has less development time and low development cost. This can be balanced with increased test length.
23. In pseudo-random testing, the test length should be ________ the exhaustive test.
A. lesser than
B. greater than
C. more than
D. none of the mentioned
Answer: A
In pseudo-random testing, the test length should be less than that of the exhaustive test (its upper bound. or the test length will be prohibited for most circuits. This makes the pseudo-random testing practical.
24. Pseudo-random testing method involves
A. homogeneous Bernoulli process
B. non-homogeneous Bernoulli process
C. repeatable Bernoulli process
D. non-repeatable Bernoulli process
Answer: B
The most accurate method involved in test pattern generation is the non-homogeneous Bernoulli process. This is called as a pseudo-random testing method.
25. Which method is more accurate?
A. pseudo-random testing
B. random testing
C. LFSR
D. cellular automata
Answer: A
The pseudo-random testing method gives more accurate results than the random testing method. Its test length estimation is smaller and test quality is better.
26. The fault coverage in a pseudo-random test is determined using
A. fault detection
B. fault removal
C. fault simulation
D. fault distribution
Answer: C
The fault coverage in a pseudo-random test can be determined by using fault simulation. The fault coverage is the measure used to rate the algorithmically generated test set.
27. Faults causing the largest loss of coverage are those with
A. smallest detectability
B. largest detectability
C. all of the mentioned
D. none of the mentioned
Answer: A
Faults causing the largest loss of coverage are those with the smallest detectability. These faults are counted in the initial nonzero elements of the detectability profile.
28. With a test sequence of length zero, fault coverage is
A. maximum
B. 1
C. 0
D. cannot be determined
Answer: C
With a test sequence of length zero, the fault coverage is 0 and each fault is responsible for fault coverage loss regardless of its detectability.
29. Upper bound fault is the fault with detectability
A. 0
B. 1
C. maximum
D. minimum
Answer: B
Upper bound fault is the fault with detectability k=1 and it is used where the detectability profile of the circuit under test is unknown.
30. To reduce the size mismatch, test length is minimized.
A. true
B. false
Answer: A
If the size of the pseudo-random test generator does not match the size of the circuit under test, a size mismatch occurs. This can be compromised by reducing the test length.
