Embedded System Validation MCQ Quiz – Objective Question with Answer for Embedded System Validation

While testing any devices or embedded systems, we apply some selected inputs which is known as the test pattern and observe the output. This output is compared with the expected output. The test patterns are normally applied to the already manufactured systems.

For testing any devices or embedded systems, we use some sort of selected input which is known as the test pattern, and observe the output and is compared it with the expected output. These test patterns are normally applied to the manufactured systems.

The test pattern generation is normally based on the fault models and this model is also known as the stuck-at model. The test pattern is based on a certain assumption, that is why it is called the stuck-at model.

The test pattern generation is based on the fault models and this type of model is also known as the stuck-at model. These test patterns are based on a certain assumption, hence it is known as the stuck-at model.

The quality of the test pattern can be evaluated based on the fault coverage. It is the percentage of potential faults that can be found for a given test pattern set, that is fault coverage equals the number of detectable faults for a given test pattern set divided by the number of faults possible due to the fault model.

The design of testability or DfT is the process of designing for better testability.

Design for testability is a design technique that makes testing a chip possible and cost-effective by adding additional circuitry to the chip.

Design-for-testability techniques improve the controllability and observability of internal nodes, so that embedded functions can be tested.

The JTAG is a technique for connecting scan chains of several chips and is also known as a boundary-scan.

JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to digital simulation.

The BILBO or the built-in logic block observer is proposed as a circuit combining, test response compaction, test pattern generation, and serial input/output capabilities.

• The CRC or the cyclic redundancy check is the error detecting code that is commonly used in the storage device and the digital networks.
• Cyclic Redundancy Check is a method of detecting accidental changes/errors in the communication channel.

The FSM is a finite state machine. It will be having a finite number of states and is used to design both the sequential logic circuit and the computer programs. It can be used for testing the scan design in the testing techniques.

All the flip-flop storing states are connected to form a shift register in the scan design. It is a kind of test path.

The FTA is Fault tree analysis which is a top-down method of analyzing risks. It starts with damage and comes up with the reasons for the damage. The analysis is done graphically by using gates.

The FTA is also known as the Fault tree analysis which is a top-down method of analyzing risks. The analysis starts with damage and comes up with the reasons for the damage. The analysis can be checked graphically by using gates.

The fault tree analysis is done graphically by using gates mainly AND gates and OR gates. The OR gate is used to represent a single event that is hazardous. Similarly, AND gates are used in the graphical representation if several events cause hazards.

The FTA is done graphically by using gates mainly AND gates and OR gates. The OR gate is used to represent a single event that is hazardous.

The fault tree analysis is done graphically by using gates. The main gates used are AND gates and OR gates. The AND gates are used in the graphical representation if several events cause hazards.

The FMEA is the failure mode and the effect analysis, in which the analysis starts at the components and tries to estimate their reliability.

The fine-grained model has the cycle-true instruction set simulation. In this modeling, it is possible to compute the exact number of clock cycles that are required to run an application.

The switch model can be used in the simulation of the transistors since the transistor is the very basic component of a switch. It is capable of reflecting bidirectional transferring of the information.

Many formal verification techniques are used and these are classified based on the logic employed. The techniques are propositional logic, first-order logic, and higher-order logic. The FOL is the abbreviated form of the first-order logic which includes the quantification.

The formal verification techniques are classified based on the logic employed. The techniques are propositional logic, first-order logic, and higher-order logic. The HOL is the abbreviation of the higher-order logic in which the proofs are automated and manually done with some proof support.

The binary decision diagram is a kind of data structure that is used to represent the Boolean function.

The value of a boolean function can be determined by following a path in its BDD down to a terminal, making a binary decision at each node where a solid line is followed if the value of the variable at the node is true and a dotted line if it is false.

The propositional logic technique is having the boolean formulas and the boolean function. The tools used in propositional logic are the tautology checker or the equivalence checker which in turn uses the binary decision diagrams which are also known as BDD.

The propositional logic technique consists of the boolean formulas and the boolean function. The tools used in this type of logic are the tautology checker or the equivalence checker which in turn uses the BDD or the binary decision diagrams.

The model checking was developed using the binary decision diagram and the BDD and it was possible to locate errors in the specification of the future bus protocol.

The EMC system is developed by Clark and it describes the CTL formulas, which is the computational tree logic.

The EMC-system is a popular system for model checking which is developed by Clark that describes the CTL formulas, which is also known as computational tree logic. The CTL consists of two parts, a path quantifier, and a state quantifier.