211. Which is not the function of LSSD method?
A. eliminates hazards
B. eliminates races
C. simplifies fault generation
D. stores the data
Answer: D
The advantages of LSSD are that it eliminates races and hazards, and simplifies fault generation and fault simulation.
212. Boundary-scan test is used to test
A. pins
B. multipliers
C. boards
D. wires
Answer: C
The boundary-scan test involves scan path and self-testing to resolve the problems associated with boards carrying VLSI circuits.
213. The boundary scan path is provided with
A. serial input pads
B. parallel input pads
C. parallel output pads
D. buffer pads
Answer: A
The boundary scan path is provided with serial input and output pads and with appropriate clock pads.
214. The boundary scan path tests the
A. input nodes
B. output nodes
C. buffer nodes
D. interconnection points
Answer: D
The boundary scan path tests the interconnection between the various chips on the board.
215. Boundary-scan method takes lesser time on test pattern generation.
A. true
B. false
Answer: A
The boundary-scan method takes lesser time on test pattern generation and application.
216. The disadvantage of the boundary-scan method is that the fault coverage is less.
A. true
B. false
Answer: B
The boundary scan test method is simplified and efficient and also its fault coverage is increased.
217. Which occupies a lesser area?
A. lssd
B. boundary scan test
C. serial scan
D. partial scan
Answer: D
The partial scan is derived from the scan path technique and it consumes very less area.
218. The partial scan approach scan
A. all input node faults
B. all output node faults
C. faults not detected by designer functional vector
D. all faults
Answer: C
The partial scan approach detects faults that are not detected by the designer’s functional vectors.
219. In scan/set method __________ is used to implement a scan path.
A. serial registers
B. storage elements
C. parallel registers
D. separate register
Answer: D
In the scan/set method, storage elements are not used to implement a scan path. A separate register is added to scan test data in and out.
220. Built-in self-test aims to
A. reduce test pattern generation cost
B. reduce the volume of test data
C. reduce test time
D. all of the mentioned
Answer: D
Built-in self-test objectives are to reduce test pattern generation cost, reduce the volume of test data, and reduce test time.
221. In the data compression technique, the comparison is done on
A. test response
B. entire test data
C. data inputs
D. output sequences
Answer: A
In the data compression technique, the comparison is made on compacted test responses instead of entire test data.
222. Signature analysis performs
A. addition
B. multiplication
C. polynomial division
D. amplifies
Answer: C
Signature analysis performs polynomial division which is the division of data out of the device under test.
223. The signature analysis method can be represented mathematically as
A. R(x) = P(x) * C(x)
B. R(x) = P(x) / C(x)
C. R(x) = C(x) / P(x)
D. R(x) = C(x) * P(x)
Answer: B
The signature analysis method is represented mathematically as R(x) = P(x) / C(x) where R(x) is the signature, C(x) is characteristic polynomial.
224. Transition counting does the count of transition only in one specific direction at a time.
A. true
B. false
Answer: A
Transition counting does the count of transition in the specified direction (0 t0 1 or 1 to 0).
225. BILBO uses only the signature analysis.
A. true
B. false
Answer: B
The built-in logic block observer method uses signature analysis in conjunction with a scan path.
226. In which mode, storage elements are used independently?
A. normal mode
B. test 1 mode
C. test 2 mode
D. final mode
Answer: A
In normal mode, storage elements are used independently, and in this mode signal B1=B2=1.
227. Storage elements are connected as a serial shift register when
A. B1=B2=1
B. B1=B2=0
C. B1=0, B2=1
D. B1=1, B2=0
Answer: B
When B1=B2=0 storage elements are configured as scan paths, they are connected as a serial shift registers.
228. The circuit is configured as LFSR, when
A. B1=B2=1
B. B1=B2=0
C. B1=0, B2=1
D. B1=1, B2=0
Answer: D
When B1=1 and B2=0 the circuit is configured as LFSR mode and can be used as either polynomial divider or random test pattern generator.
229. The BILBO is reset, when
A. B1=B2=1
B. B1=B2=0
C. B1=0, B2=1
D. B1=1, B2=0
Answer: C
When B1=0 and B2=1 are in the final mode, the BILBO is reset.
230. The self-checking technique consists of
A. supplying coded input data
B. receiving coded output data
C. supplying all possible input sequence
D. all of the mentioned
Answer: A
The self-checking technique consists of supplying coded input data to the logic block under test and comparing the output.
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