11. Which has more number of I/O pins?
A. lssd
B. partial scan
C. scan/set
D. random access scan
Answer: D
The random access scan method’s major disadvantage is that it has more number of I/O pins and no shift registers with flipflops are used.
12. Scan/set method has no interruption to normal operation.
A. true
B. false
Answer: A
The scan/set method has separate shift registers and has no interruption to normal operation.
13. Which method has a high overhead cost?
A. lssd
B. partial scan
C. scan/set
D. random access scan
Answer: C
The scan/set method has a high overhead cost in terms of additional input/output pins.
14. The serial shift register is driven using
A. one over-lapping clock
B. two over-lapping clock
C. one non-over-lapping clock
D. two non-over-lapping clock
Answer: D
The serial shift register is driven using two non-over-lapping clocks which can be controlled by the primary inputs of the circuit.
15. Which is used to control the scan path movement?
A. clock signals
B. input signals
C. output signals
D. delay signals
Answer: A
Two clock signals are used to control the scan path movements through the shift register latches.
16. The circuit operation is independent of
A. rise time
B. fall time
C. propagation delays
D. all of the mentioned
Answer: D
The circuit operation is independent of dynamic characteristics of the logic elements like rising time, fall time, and propagation delays.
17. Which is not the function of LSSD method?
A. eliminates hazards
B. eliminates races
C. simplifies fault generation
D. stores the data
Answer: D
The advantages of LSSD are that it eliminates races and hazards, and simplifies fault generation and fault simulation.
18. Boundary-scan test is used to test
A. pins
B. multipliers
C. boards
D. wires
Answer: C
A boundary-scan test involves scan path and self-testing to resolve the problems associated with boards carrying VLSI circuits.
19. The boundary scan path is provided with
A. serial input pads
B. parallel input pads
C. parallel output pads
D. buffer pads
Answer: A
The boundary scan path is provided with serial input and output pads and with appropriate clock pads.
20. The boundary scan path tests the
A. input nodes
B. output nodes
C. buffer nodes
D. interconnection points
Answer: D
The boundary scan path tests the interconnection between the various chips on the board.
