1. Which method is used to determine structural defects?
A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
2. Which is known as the stored test pattern method?
A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
3. Which method uses a finite state machine for developing the test pattern?
A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
4. A n-bit counter produces ______ number of total input combinations.
A. 2(n-1)
B. 2(n+1)
C. 2n
D. 2n
5. Exhaustive test pattern determines
A. gate-level faults
B. logic level faults
C. functional faults
D. structural faults
6. Exhaustive test pattern also detects delay faults.
A. true
B. false
7. Which is not suitable for circuits having large N values?
A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. deterministic test pattern method
8. Which method needs fault simulation?
A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. deterministic test pattern method
9. In which method sequences are repeatable?
A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. pseudo-random test pattern method
10. Which method is used for external functional testing?
A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. pseudo-random test pattern method