VLSI Built-in Self Test MCQ Quiz – Objective Question with Answer for Built-in Self Test for VLSI
Built-in self-test aims to A. reduce test pattern generation cost B. reduce the volume of test data C. reduce test time D. all of the mentioned 2. In the data compression technique, the comparison is done on A. test response B. entire test data C. data inputs D. output sequences Answer: A In the …